20 Patents
- US125663682026Method for Determining a Mask Pattern Comprising Optical Proximity Corrections Using a Trained Machine Learning Model
ASML NETHERLANDS
0 cites - US125603072026Light Source System with Lens Array Adjusting Mechanism and Light Emitting Device
YLX INCORPORATED
0 cites - 0 cites
- US125506902026Semiconductor Device Having Shallow Trench Isolation Structures and Fabrication Method Thereof
YANGTZE MEMORY TECHNOLOGIES CO., Ltd.
0 cites - US125139252025Insulated Gate Bipolar Transistor, Motor Control Unit, and Vehicle
HUAWEI TECHNOLOGIES CO., Ltd.
0 cites - US124396052025Semiconductor Device, Three-dimensional Memory and Method for Fabricating the Semiconductor Device
YANGTZE MEMORY TECHNOLOGIES CO., Ltd.
0 cites - US124304902025Method for Generating Patterning Device Pattern at Patch Boundary
ASML NETHERLANDS B.V.
0 cites - US123349132025Drmos, Integrated Circuit, Electronic Device, and Preparation Method
HUAWEI TECHNOLOGIES CO., Ltd.
0 cites - US122861322025Vehicle Systems and Methods for Autonomous Route Following
GM GLOBAL TECHNOLOGY OPERATIONS LLC
0 cites - US121679192024System and Method for Non-invasive, Intracranial Brain Motion Monitoring
The General Hospital Corporation
0 cites - US120994812024Online Schema Change of Range-partitioned Index in a Distributed Storage System
Microsoft Technology Licensing, LLC
0 cites - US119721942024Method for Determining Patterning Device Pattern Based on Manufacturability
ASML NETHERLANDS B.V.
0 cites - 0 cites
- US118831822024System and Method for Non-invasive, Intracranial Brain Motion Monitoring
The General Hospital Corporation
0 cites - 0 cites
- US118160842023Staging Anchor Trees for Improved Concurrency and Performance in Page Range Index Management
Microsoft Technology Licensing, LLC
0 cites - US117977482023Method for Generating Patterning Device Pattern at Patch Boundary
ASML NETHERLANDS B.V.
0 cites - US117344902023Method for Determining Curvilinear Patterns for Patterning Device
ASML NETHERLANDS B.V.
0 cites - 0 cites
- US115802892023Method for Determining Patterning Device Pattern Based on Manufacturability
ASML Netherlands B.V.
0 cites