Patents/Inventors

Qinglang Meng

BeijingCN1 patent

3 Patents

US119086572024
Scanning Electron Microscope Device and Electron Beam Inspection Apparatus
Zhongke Jingyuan Electron Limited
0 cites
US119086582024
Scanning Electron Microscope Device and Electron Beam Inspection Apparatus
Zhongke Jingyuan Electron Limited
0 cites
US117567612023
Wien Filter and Charged Particle Beam Imaging Apparatus
Zhongke Jingyuan Electron Limited, Beijing (CN)
0 cites