14 Patents
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- US124712782025Three-dimensional Memory Device with Charge Trap Layer Including Carbon Region and Fabrication Method Thereof
Yangtze Memory Technologies Co., Ltd.
0 cites - US123174912025Three-dimensional Memory Device and Fabrication Method for Enhanced Reliability
Yangtze Memory Technologies Co., Ltd.
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- US120161802024Manufacturing Method of Three-dimensional Memory Device with Improved RC Delay
Yangtze Memory Technologies Co., Ltd.
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- US118390792023Three-dimensional Memory Devices and Methods for Forming the Same
YANGTZE MEMORY TECHNOLOGIES CO., Ltd.
0 cites - US1183908320233D NAND Memory Device and Method of Forming the Same
Yangtze Memory Technologies Co., Ltd.
0 cites - US118126112023Three-dimensional Memory Devices and Methods for Forming the Same
YANGTZE MEMORY TECHNOLOGIES CO., Ltd.
0 cites - US117513892023Three-dimensional Memory Device with Reduced Memory Unit Interference and Manufacturing Method Thereof
Yangtze Memory Technologies Co., Ltd.
0 cites - US116964442023Semiconductor Device and Method of Fabrication Thereof
YANGTZE MEMORY TECHNOLOGIES CO., Ltd.
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- US116659052023Three-dimensional Memory Device and Manufacturing Method Thereof
YANGTZE MEMORY TECHNOLOGIES CO., Ltd.
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