15 Patents
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- US124313492025In-situ Control of Film Properties During Atomic Layer Deposition
Lam Research Corporation
0 cites - US123548712025Ultrathin Atomic Layer Deposition Film Accuracy Thickness Control
Lam Research Corporation
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- US122886852025Modifying Hydrophobicity of a Wafer Surface Using an Organosilicon Precursor
Lam Research Corporation
0 cites - US121257052024Method for Providing Doped Silicon Using a Diffusion Barrier Layer
LAM RESEARCH CORPORATION
0 cites - US120778592024Variable Cycle and Time RF Activation Method for Film Thickness Matching in a Multi-station Deposition System
Lam Research Corporation
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- US120496992024Dielectric Gapfill Using Atomic Layer Deposition (ALD), Inhibitor Plasma and Etching
LAM RESEARCH CORPORATION
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- US116519632023Method of Improving Deposition Induced CD Imbalance Using Spatially Selective Ashing of Carbon Based Film
Lam Research Corporation
0 cites - US116461982023Ultrathin Atomic Layer Deposition Film Accuracy Thickness Control
Lam Research Corporation
0 cites