Prashanth Kumar

7 Patents

• US124298462025

  Systems and Methods for Adaptive Troubleshooting of Semiconductor Manufacturing Equipment

  Applied Materials, Inc.

  0 cites
• US122835032025

  Substrate Measurement Subsystem

  Applied Materials, Inc.

  0 cites
• US121911762025

  Integrated Substrate Measurement System to Improve Manufacturing Process Performance

  Applied Materials, Inc.

  0 cites
• US121365572024

  Integrated Substrate Measurement System to Improve Manufacturing Process Performance

  Applied Materials, Inc.

  0 cites
• US120614582024

  Systems and Methods for Adaptive Troubleshooting of Semiconductor Manufacturing Equipment

  Applied Materials, Inc.

  0 cites
• US116886162023

  Integrated Substrate Measurement System to Improve Manufacturing Process Performance

  Applied Materials, Inc.

  0 cites
• USD09775042023

  Portion of a Display Panel with a Graphical User Interface

  Applied Materials, Inc.

  0 cites