10 Patents
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- US119338442024Path Based Controls for ATE Mode Testing of Multicell Memory Circuit
TEXAS INSTRUMENTS INCORPORATED
0 cites - US119211592024Compressed Scan Chain Diagnosis by Internal Chain Observation, Processes, Circuits, Devices and Systems
Texas Instruments Incorporated
0 cites - US118799402024Dynamic Generation of ATPG Mode Signals for Testing Multipath Memory Circuit
TEXAS INSTRUMENTS INCORPORATED
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- US117092032023Transition Fault Testing of Functionally Asynchronous Paths in an Integrated Circuit
TEXAS INSTRUMENTS INCORPORATED
0 cites - US115924832023Compressed Scan Chain Diagnosis by Internal Chain Observation, Processes, Circuits, Devices and Systems
TEXAS INSTRUMENTS INCORPORATED
0 cites - 0 cites