Po-zen Chen

7 Patents

• US124446602025

  Test Structure for Void and Topography Monitoring in a Flash Memory Device

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US122611882025

  Image Sensor Device and Methods of Forming the Same

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US121913382025

  Image Sensor Device and Methods of Forming the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US121835502024

  Wafer Treatment System and Method of Treating Wafer

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED

  0 cites
• US120949972024

  BSI Chip with Backside Alignment Mark

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US116521272023

  Image Sensor Device and Methods of Forming the Same

  Taiwan Semiconductor Manufacturing Company Limited

  0 cites
• US116521332023

  Image Sensor Grid and Method of Manufacturing Same

  Taiwan Semiconductor Manufacturing Co.

  0 cites