Po-chih Chen

12 Patents

• US124190742025

  Barrier Structure Configured to Increase Performance of III-V Devices

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US123242112025

  Ring Transistor Structure

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US122782722025

  Source Leakage Current Suppression by Source Surrounding Gate Structure

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US121071562024

  Semiconductor Structure, HEMT Structure and Method of Forming the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY Ltd.

  0 cites
• US120948382024

  Crack Stop Ring Trench to Prevent Epitaxy Crack Propagation

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US120465372024

  Front-end-of-line (FEOL) Through Semiconductor-on-substrate via (TSV)

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US118626752024

  High Voltage Metal-oxide-semiconductor (HVMOS) Device Integrated with a High Voltage Junction Termination (HVJT) Device

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US117962762023

  Gun

  0 cites
• US117988992023

  Crack Stop Ring Trench to Prevent Epitaxy Crack Propagation

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US117913882023

  Source Leakage Current Suppression by Source Surrounding Gate Structure

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US117157922023

  Barrier Structure Configured to Increase Performance of III-V Devices

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites
• US116644312023

  Ring Transistor Structure

  Taiwan Semiconductor Manufacturing Company, Ltd.

  0 cites