14 Patents
- US125640282026Dielectric Layers Having Nitrogen-containing Crusted Surfaces
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd
0 cites - US124244382025Low-k Dielectric and Processes for Forming Same
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US124179482025Hybrid Film Scheme for Self-aligned Contact
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US123879742025Patterning Interconnects and Other Structures by Photo-sensitizing Method
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - 0 cites
- US123025952025Dummy Hybrid Film for Self-alignment Contact Formation
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites - US121989792025Semiconductor Device with Multi-layer Etch Stop Structure
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - 0 cites
- US121486962024Methods for Reducing Dual Damascene Distortion
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US120626132024Semiconductor Device Having an Extra Low-k Dielectric Layer and Method of Forming the Same
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - US120338902024Patterning Interconnects and Other Structures by Photo-sensitizing Method
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites - US118482312023Method for Forming Semiconductor Device with Multi-layer Etch Stop Structure
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites - 0 cites
- US116768552023Patterning Interconnects and Other Structures by Photo-sensitizing Method
TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.
0 cites