9 Patents
- US125422532026Charged Particle Optics, Charged Particle Beam Apparatus, and Method for Scanning a Charged Particle Beam
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - US124127272025Charged Particle Beam System, Corrector for Aberration Correction of a Charged Particle Beam, and Method Thereof
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - USRE0505402025Method for Inspecting a Sample Using an Assembly Comprising a Scanning Electron Microscope and a Light Microscope
DELMIC IP B.V.
0 cites - US123621312025Method for Inspecting a Specimen and Charged Particle Beam Device
TECHNISCHE UNIVERSITEIT DELFT
0 cites - 0 cites
- US120625192024Beam Deflection Device, Aberration Corrector, Monochromator, and Charged Particle Beam Device
Hitachi High-tech Corporation
0 cites - US119617092024Charged Particle Beam Device for Inspection of a Specimen with a Plurality of Charged Particle Beamlets
FEI Company
0 cites - 0 cites
- 0 cites