Pieter Gerardus Jacobus Smorenberg

5 Patents

• US125786532026

  Method for Determining a Sampling Scheme, a Semiconductor Substrate Measurement Apparatus, a Lithographic Apparatus

  ASML NETHERLANDS B.V.

  0 cites
• US125786552026

  Sub-field Control of a Lithographic Process and Associated Apparatus

  ASML NETHERLANDS B.V.

  0 cites
• US117684412023

  Method for Controlling a Manufacturing Process and Associated Apparatuses

  ASML NETHERLANDS B.V.

  0 cites
• US116690172023

  Method for Controlling a Manufacturing Apparatus and Associated Apparatuses

  ASML NETHERLANDS B.V.

  0 cites
• US116626662023

  Sub-field Control of a Lithographic Process and Associated Apparatus

  ASML NETHERLANDS B.V.

  0 cites