Peter William Neff

3 Patents

• US122480032025

  Clustered Rigid Wafer Test Probe

  International Business Machines Corporation

  0 cites
• US116750102023

  Compliant Wafer Probe Assembly

  International Business Machines Corporation

  0 cites
• US116623662023

  Wafer Probe with Elastomer Support

  International Business Machines Corporation

  0 cites