Patents/Inventors

Peter Christiaan Tiemeijer

EindhovenNL10 patents

10 Patents

US125059962025
EELS Auto-alignment Using Full Image Simulation
FEI Company
0 cites
US122550452025
Transmission Charged Particle Microscope with an Electron Energy Loss Spectroscopy Detector
FEI Company
0 cites
US121761792024
Method, Device and System for Reducing Off-axial Aberration in Electron Microscopy
FEI Company
0 cites
US121005852024
Energy Spectrometer with Dynamic Focus
FEI Company
0 cites
US119886182024
Method and System to Determine Crystal Structure
FEI Company
0 cites
US119553102024
Transmission Charged Particle Microscope with an Electron Energy Loss Spectroscopy Detector
FEI Company
0 cites
US119487712024
Method of Determining an Energy Width of a Charged Particle Beam
FEI Company
0 cites
US118172902023
Method, Device and System for Reducing Off-axial Aberration in Electron Microscopy
FEI Company
0 cites
US118043572023
Electron Optical Module for Providing an Off-axial Electron Beam with a Tunable Coma
FEI Company
0 cites
US115877592023
Method, Device and System for Reducing Off-axial Aberration in Electron Microscopy
FEI Company
0 cites