Patents/Inventors

Peng Luan

ShijiazhuangCN1 patent

2 Patents

US119714512024
Method for Determining Parameters in On-wafer Calibration Piece Model
The 13Th Research Institute Of China Electronics Technology Group Corporation
0 cites
US117332982023
Two-port On-wafer Calibration Piece Circuit Model and Method for Determining Parameters
The 13Th Research Institute Of China Electronics Technology Group Corporation
0 cites