5 Patents
- US125801502026Systems and Methods for Analyzing a Sample Using Charged Particle Beams and Active Pixel Control Sensors
FEI Company
0 cites - 0 cites
- US120990242024Methods and Apparatus for Electron Backscatter Diffraction Sample Characterisation
VG Systems Limited
0 cites - 0 cites
- US116767952023Charged Particle Beam Device for Inspection of a Specimen with a Plurality of Charged Particle Beamlets
FEI Company
0 cites