Patents/Inventors

Pavel Potocek

EindhovenNL9 patents

9 Patents

US125487322026
Application Management for Charged Particle Microscope Devices
FEI Company
0 cites
US123927352025
Sparse Image Reconstruction from Neighboring Tomography Tilt Images
FEI Company
0 cites
US122886672025
Live-assisted Image Acquisition Method and System with Charged Particle Microscopy
FEI Company
0 cites
US122237522025
Data Acquisition in Charged Particle Microscopy
FEI Company
0 cites
US121365322024
Dual Speed Acquisition for Drift Corrected, Fast, Low Dose, Adaptive Compositional Charged Particle Imaging
FEI Company
0 cites
US120855232024
Adaptive Specimen Image Acquisition Using an Artificial Neural Network
FEI Company
0 cites
US120021942024
Training an Artificial Neural Network Using Simulated Specimen Images
FEI Company
0 cites
US119826342024
Adaptive Specimen Image Acquisition
FEI Company
0 cites
US117417302023
Charged Particle Microscope Scan Masking for Three-dimensional Reconstruction
FEI Company
0 cites