9 Patents
- US124943882025Methods and Apparatus for Measuring Temperature Using Centerfind Systems
Applied Materials, Inc.
0 cites - US124761202025Modular Mainframe Layout for Supporting Multiple Semiconductor Process Modules or Chambers
Applied Materials Inc.
0 cites - 0 cites
- US122159662025Methods and Systems of Optical Inspection of Electronic Device Manufacturing Machines
Applied Materials, Inc.
0 cites - 0 cites
- US119357702024Modular Mainframe Layout for Supporting Multiple Semiconductor Process Modules or Chambers
APPLIED MATERIALS, Inc.
0 cites - US119357712024Modular Mainframe Layout for Supporting Multiple Semiconductor Process Modules or Chambers
APPLIED MATERIALS, Inc.
0 cites - US118137572023Centerfinding for a Process Kit or Process Kit Carrier at a Manufacturing System
APPLIED MATERIALS, Inc.
0 cites - 0 cites