Patents/Inventors

Patrick John Tae

Palo Alto, CAUS7 patents

7 Patents

US125371792026
Capacitive Sensing Data Integration for Plasma Chamber Condition Monitoring
Applied Materials, Inc.
0 cites
US124379792025
Capacitive Sensors and Capacitive Sensing Locations for Plasma Chamber Condition Monitoring
Applied Materials, Inc.
0 cites
US121639112024
Capacitive Sensor Housing for Chamber Condition Monitoring
Applied Materials, Inc.
0 cites
US120092362024
Sensors and System for In-situ Edge Ring Erosion Monitor
Applied Materials, Inc.
0 cites
US115812062023
Capacitive Sensor for Chamber Condition Monitoring
Applied Materials, Inc.
0 cites
US115519052023
Resonant Process Monitor
Intel Corporation
0 cites
US115453462023
Capacitive Sensing Data Integration for Plasma Chamber Condition Monitoring
Applied Materials, Inc.
0 cites