Patricius Aloysius Jacobus Tinnemans

11 Patents

• US126079462026

  Metrology Method and Associated Metrology and Lithographic Apparatuses

  ASML Netherlands B.V.

  0 cites
• US124614512025

  Computational Metrology

  ASML NETHERLANDS B.V.

  0 cites
• US124055352025

  Method for Filtering an Image and Associated Metrology Apparatus

  ASML Netherlands B.V.

  0 cites
• US123668112025

  Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US121893052025

  Metrology Method and Apparatus and Computer Program

  ASML Netherlands B.V.

  0 cites
• US121122602024

  Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US120667642024

  Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US120322992024

  Metrology Method and Associated Metrology and Lithographic Apparatuses

  ASML NETHERLANDS B.V.

  0 cites
• US120077002024

  Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US117094362023

  Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites
• US116500472023

  Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate

  ASML Netherlands B.V.

  0 cites