9 Patents
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- US122278472025Level Monitoring and Active Adjustment of a Substrate Support Assembly
Applied Materials, Inc.
0 cites - US121966172025Temperature Profile Measurement and Synchronized Control on Substrate and Susceptor in an Epitaxy Chamber
Applied Materials, Inc.
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- US118609732024Method and System for Foreline Deposition Diagnostics and Control
Applied Materials, Inc.
0 cites - US117330812023Methods, Systems, and Apparatus for Conducting a Calibration Operation for a Plurality of Mass Flow Controllers (mfcs) of a Substrate Processing System
Applied Materials, Inc.
0 cites - 0 cites