25 Patents
- US126158182026Semiconductor Transistor Devices Including Alternatively Stacked Source/drain Regions
Samsung Electronics Co., Ltd.
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- US125573622026Semiconductor Device Including Source/drain Pattern with Varied Germanium Concentrations
SAMSUNG ELECTRONICS CO., Ltd.
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- US124777962025Semiconductor Device Including a Vertically Stacked Channel Pattern and Method for Manufacturing the Same
Samsung Electronics Co., Ltd.
0 cites - US124713452025Semiconductor Device and Method for Manufacturing the Same
Samsung Electronics Co., Ltd.
0 cites - US124531482025Integrated Circuit Device Including Field-effect Transistor with Controlled Sizes and Configurations
Samsung Electronics Co., Ltd.
0 cites - US124531412025Semiconductor Device Including Barrier Layer Between Active Region and Semiconductor Layer and Method of Forming the Same
Samsung Electronics Co., Ltd.
0 cites - US124263592025Semiconductor Device Including Source/drain Regions Having Triangular Tip Regions
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
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- US123241952025Multi-channel Field Effect Transistors with Enhanced Multi-layered Source/drain Regions
Samsung Electronics Co., Ltd.
0 cites - 0 cites
- US122243572025Semiconductor Transistor Device Including Multiple Channel Layers with Different Materials
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US121193472024Method of Manufacturing a Horizontal-nanosheet Field-effect Transistor
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120275962024Semiconductor Device with Source/drain Pattern Including Buffer Layer
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US119964432024Semiconductor Device Including Barrier Layer Between Active Region and Semiconductor Layer and Method of Forming the Same
Samsung Electronics Co., Ltd.
0 cites - 0 cites
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- US116887782023Semiconductor Device Including Three-dimensional Field-effect Transistor with Curved Multi-layered Source/drain Pattern
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US116769632023Integrated Circuit Device and Method of Manufacturing the Same
Samsung Electronics Co., Ltd.
0 cites - 0 cites