Orion Jonathan Pierre Mouraille

2 Patents

• US121893082025

  Method for Adjusting a Target Feature in a Model of a Patterning Process Based on Local Electric Fields

  ASML NETHERLANDS B.V.

  0 cites
• US116198842023

  Method for Adjusting a Target Feature in a Model of a Patterning Process Based on Local Electric Fields

  ASML NETHERLANDS B.V.

  0 cites