Patents/Inventors

Ori Golani

Ramat GanIL2 patents

3 Patents

US122780852025
Hybrid Scanning Electron Microscopy and Acousto-optic Based Metrology
APPLIED MATERIALS ISRAEL Ltd.
0 cites
US118599632024
Depth Profiling of Semiconductor Structures Using Picosecond Ultrasonics
Applied Materials Israel Ltd
0 cites
US118154702023
Multi-perspective Wafer Analysis
Applied Materials Israel, Ltd.
0 cites