3 Patents
- US122999512025Edge Center Point-based Characterization of Semiconductor Layout Designs
Siemens Industry Software Inc.
0 cites - US121824872024Controllable Pattern Clustering for Characterized Semiconductor Layout Designs
Siemens Industry Software Inc.
0 cites - US116876952023Shadow Feature-based Determination of Capacitance Values for Integrated Circuit (IC) Layouts
Siemens Industry Software Inc.
0 cites