3 Patents
- US123615312025Machine Learning-based Classification of Defects in a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites - US117559842023Adaptive Positioning of Drones for Enhanced Face Recognition
Anyvision Interactive Technologies Ltd.
0 cites - US115685312023Method of Deep Learning-based Examination of a Semiconductor Specimen and System Thereof
Applied Materials Israel Ltd.
0 cites