Patents/Inventors

Ohad Bachar

TimratIL7 patents

3 Patents

US126191622026
Extra Tall Target Metrology
KLA Corporation
0 cites
US121319592024
Systems and Methods for Improved Metrology for Semiconductor Device Wafers
KLA Corporation
0 cites
US118525902023
Systems and Methods for Metrology with Layer-specific Illumination Spectra
KLA Corporation
0 cites