Nui Chong

3 Patents

• US120454692024

  Single Event Upset Tolerant Memory Device

  XILINX, Inc.

  0 cites
• US116502492023

  Wafer Testing and Structures for Wafer Testing

  XILINX, Inc.

  0 cites
• US115858542023

  Runtime Measurement of Process Variations and Supply Voltage Characteristics

  XILINX, Inc.

  0 cites