Patents/Inventors

Nobuhiro Obara

TokyoJP3 patents

4 Patents

US124223772025
Defect Inspection Apparatus and Defect Inspection Method
Hitachi High-tech Corporation
0 cites
US123456612025
Defect Inspection Apparatus and Defect Inspection Method
Hitachi High-tech Corporation
0 cites
US122352232025
Method for Defect Inspection, System, and Computer-readable Medium
Hitachi High-tech Corporation
0 cites
US120446272024
Defect Inspection Device and Defect Inspection Method
Hitachi High-tech Corporation
0 cites