Patents/Inventors

Noam Tal

Kiryat OnoIL9 patents

9 Patents

US125617932026
Machine Learning Based Examination for Process Monitoring
Applied Materials Israel Ltd.
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US124890202025
End-to-end Measurement for Semiconductor Specimens
Applied Materials Israel Ltd.
0 cites
US124691242025
Machine Learning Based Yield Prediction
Applied Materials Israel Ltd.
0 cites
US123211022025
Machine and Deep Learning Methods for Spectra-based Metrology and Process Control
NOVA Ltd.
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US122363642025
Metrology and Process Control for Semiconductor Manufacturing
NOVA Ltd
0 cites
US118746062024
System and Method for Controlling Measurements of Sample's Parameters
NOVA Ltd.
0 cites
US118158192023
Machine and Deep Learning Methods for Spectra-based Metrology and Process Control
NOVA Ltd.
0 cites
US117631812023
Metrology and Process Control for Semiconductor Manufacturing
NOVA Ltd
0 cites
US116650402023
Configurable Constellation Mapping to Control Spectral Efficiency Versus Signal-to-noise Ratio
Intel Corporation
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