Nitin Jaiswal

3 Patents

• US124935142025

  Apparatus and Methods for Memory Fault Detection Within Die Architectures

  Qualcomm Incorporated

  0 cites
• US123732912025

  Transient Fault Detection in Memory Using Dynamic BIST

  QUALCOMM INCORPORATED

  0 cites
• US121819582024

  Scalable Architecture for Error Capturing with Single Logger Approach for Automotive Systems

  QUALCOMM Incorporated

  0 cites