Patents/Inventors

Nitesh Pandey

EindhovenNL17 patents

16 Patents

US125911792026
Metrology Apparatus
ASML Netherlands B.V.
0 cites
US125664062026
Dark Field Digital Holographic Microscope and Associated Metrology Method
ASML NETHERLANDS B.V.
0 cites
US123668112025
Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate
ASML Netherlands B.V.
0 cites
US123395882025
High Force Low Voltage Piezoelectric Micromirror Actuator
ASML Netherlands B.V.
0 cites
US122767842025
Micromirror Arrays
IMEC V.z.w.
0 cites
US122595462025
Micromirror Arrays
ASML NETHERLANDS B.V.
0 cites
US121642332024
Metrology Method and Apparatus for of Determining a Complex-valued Field
ASML Netherlands B.V.
0 cites
US121584352024
Illumination and Detection Apparatus for a Metrology Apparatus
ASML NETHERLANDS B.V.
0 cites
US121177342024
Metrology Method and Device for Determining a Complex-valued Field
ASML Netherlands B.V.
0 cites
US120869732024
Detection Apparatus for Simultaneous Acquisition of Multiple Diverse Images of an Object
ASML Netherlands B.V.
0 cites
US120077002024
Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate
ASML Netherlands B.V.
0 cites
US119407392024
Metrology Apparatus
ASML Netherlands B.V.
0 cites
US119278912024
Apparatus and Methods for Determining the Position of a Target Structure on a Substrate
ASML Netherlands B.V.
0 cites
US117823512023
Metrology Device and Detection Apparatus Therefor
ASML Netherlands B.V.
0 cites
US116752762023
Metrology Apparatus and Photonic Crystal Fiber
ASML Netherlands B.V.
0 cites
US115498062023
Metrology Apparatus
ASML Netherland B.V.
0 cites