Nireekshan K. Reddy

7 Patents

• US125357442026

  Overlay Estimation Based on Optical Inspection and Machine Learning

  KLA Corporation

  0 cites
• US122221992025

  Systems and Methods for Measurement of Misregistration and Amelioration Thereof

  KLA Corporation

  0 cites
• US121659302024

  Adaptive Modeling Misregistration Measurement System and Method

  KLA Corporation

  0 cites
• US120786012024

  Universal Metrology Model

  KLA Corporation

  0 cites
• US120677452024

  Image Pre-processing for Overlay Metrology Using Decomposition Techniques

  KLA Corporation

  0 cites
• US120011482024

  Enhancing Performance of Overlay Metrology

  KLA Corporation

  0 cites
• US115927552023

  Enhancing Performance of Overlay Metrology

  KLA Corporation

  0 cites