Niravkumar Patel

3 Patents

• US118602282024

  Integrated Circuit Chip Testing Interface with Reduced Signal Wires

  XILINX, Inc.

  0 cites
• US117558042023

  Hybrid Synchronous and Asynchronous Control for Scan-based Testing

  Xilinx, Inc.

  0 cites
• US116399622023

  Scalable Scan Architecture for Multi-circuit Block Arrays

  Xilinx, Inc.

  0 cites