Patents/Inventors

Nir Bendavid

Migdal Ha'emekIL2 patents

3 Patents

US120011482024
Enhancing Performance of Overlay Metrology
KLA Corporation
0 cites
US117619692023
System and Method for Analyzing a Sample with a Dynamic Recipe Based on Iterative Experimentation and Feedback
KLA Corporation
0 cites
US115927552023
Enhancing Performance of Overlay Metrology
KLA Corporation
0 cites