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Inventors
Nikita Naresh
Bangalore
IN
5 patents
6 Patents
US12142337
2024
System and Method for Parallel Memory Test
TEXAS INSTRUMENTS INCORPORATED
0 cites
US11852683
2023
Scan Chain Self-testing of Lockstep Cores on Reset
TEXAS INSTRUMENTS INCORPORATED
0 cites
US11776656
2023
System and Method for Parallel Memory Test
Texas Instruments Incorporated
0 cites
US11715544
2023
System and Method for Low Power Memory Test
Texas Instruments Incorporated
0 cites
US11680984
2023
Control Data Registers for Scan Testing
Texas Instruments Incorporated
0 cites
US11555853
2023
Scan Chain Self-testing of Lockstep Cores on Reset
TEXAS INSTRUMENTS INCORPORATED
0 cites