Nicholas James Keller

4 Patents

• US123862712025

  Multi-layer Calibration for Empirical Overlay Measurement

  Onto Innovation Inc.

  0 cites
• US120133502024

  Effective Cell Approximation Model for Logic Structures

  Onto Innovation Inc.

  0 cites
• US118087152023

  Target for Optical Measurement of Trenches

  Onto Innovation Inc.

  0 cites
• US116686442023

  Opto-acoustic Measurement of a Transparent Film Stack

  Onto Innovation Inc.

  0 cites