Patents/Inventors

Niccolo' Righetti

Boise, IDUS28 patents

20 Patents

US126031382026
Partial Block Read Voltage Offset
Micron Technology, Inc.
0 cites
US124616612025
Dynamic Block Categorization to Improve Reliability and Performance in Memory Sub-system
Micron Technology, Inc.
0 cites
US124230022025
Selectively Programming Retired Wordlines of a Memory Device
Micron Technology, Inc.
0 cites
US123267822025
Adjustment of Code Rate as Function of Memory Endurance State Metric
Micron Technology, Inc.
0 cites
US122609162025
Partial Block Handling in a Non-volatile Memory Device
Micron Technology, Inc.
0 cites
US121310282024
Programming Selective Word Lines During an Erase Operation in a Memory Device
Micron Technology, Inc.
0 cites
US121317882024
Read Counter Adjustment for Delaying Read Disturb Scans
MICRON TECHNOLOGY, Inc.
0 cites
US120260522024
Partitioned Memory Having Error Detection Capability
0 cites
US120025162024
Memory Block Characteristic Determination
Micron Technology, Inc.
0 cites
US119721142024
Dynamic Block Categorization to Improve Reliability and Performance in Memory Sub-system
Micron Technology, Inc.
0 cites
US119220292024
Modified Read Counter Incrementing Scheme in a Memory Sub-system
Micron Technology, Inc.
0 cites
US119010142024
Partial Block Handling in a Non-volatile Memory Device
Micron Technology, Inc.
0 cites
US118473352023
Latent Read Disturb Mitigation in Memory Devices
Micron Technology, Inc.
0 cites
US117972162023
Read Calibration Based on Ranges of Program/erase Cycles
Micron Technology, Inc.
0 cites
US117896292023
Separate Partition for Buffer and Snapshot Memory
Micron Technology, Inc.
0 cites
US117766292023
Threshold Voltage Based on Program/erase Cycles
Micron Technology, Inc.
0 cites
US117627792023
Data Block Transfer with Extended Read Buffering
Micron Technology, Inc.
0 cites
US116935872023
System Driven Pass-through Voltage Adjustment to Improve Read Disturb in Memory Devices
Micron Technology, Inc.
0 cites
US116947632023
Read Voltage Calibration for Copyback Operation
Micron Technology, Inc.
0 cites
US116884792023
Read Window Based on Program/erase Cycles
Micron Technology, Inc.
0 cites