5 Patents
- US125499152026In-sync Digital Waveform Comparison to Determine Pass/fail Results of a Device Under Test (DUT)
ROKU, Inc.
0 cites - US121907162025Methods and Apparatus for Outputting a Haptic Signal to a Haptic Transducer
Cirrus Logic Inc.
0 cites - US118439212023In-sync Digital Waveform Comparison to Determine Pass/fail Results of a Device Under Test (DUT)
ROKU, Inc.
0 cites - US116367422023Methods and Apparatus for Outputting a Haptic Signal to a Haptic Transducer
Cirrus Logic, Inc.
0 cites - US116322002023Measuring and Evaluating a Test Signal Generated by a Device Under Test (DUT)
ROKU, Inc.
0 cites