Patents/Inventors

Natsuki Tsuno

TokyoJP17 patents

17 Patents

US126092692026
Inspection System
Hitachi High-tech Corporation
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US126092742026
Charged Particle Beam Device
Hitachi High-tech Corporation
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US125735862026
Charged Particle Beam Apparatus
HITACHI HIGH-TECH CORPORATION
0 cites
US124507152025
System for Deriving Electrical Characteristics and Non-transitory Computer-readable Medium
Hitachi High-tech Corporation
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US124379622025
Charged Particle Beam Apparatus
Hitachi High-tech Corporation
0 cites
US124068262025
Charged Particle Beam Device and Sample Observation Method
HITACHI HIGH-TECH CORPORATION
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US123940412025
System for Deriving Electrical Characteristics and Non-transitory Computer-readable Medium
Hitachi High-tech Corporation
0 cites
US121968022025
Semiconductor Inspection Device and Method for Inspecting Semiconductor Sample
HITACHI HIGH-TECH CORPORATION
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US121815132024
Inspection Method
Hitachi High-tech Corporation
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US120015212024
Adjusting Method of Charged Particle Beam Device and Charged Particle Beam Device System
Hitachi High-tech Corporation
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US118697452024
Charged Particle Beam Device
HITACHI HIGH-TECH CORPORATION
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US117761032023
System for Deriving Electrical Characteristics and Non-transitory Computer-readable Medium
Hitachi High-tech Corporation
0 cites
US117494942023
Charged Particle Beam Apparatus
HITACHI HIGH-TECH CORPORATION
0 cites
US116943252023
System for Deriving Electrical Characteristics and Non-transitory Computer-readable Medium
Hitachi High-tech Corporation
0 cites
US116461722023
Charged Particle Beam Apparatus
HITACHI HIGH-TECH CORPORATION
0 cites
US116315682023
Device Defect Detection Method Using a Charged Particle Beam
HITACHI HIGH-TECH CORPORATION
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US116107542023
Charged Particle Beam Device
HITACHI HIGH-TECH CORPORATION
0 cites