Patents/Inventors

Naoaki Kondo

TokyoJP6 patents

6 Patents

US125640162026
Defect Observation Method, Apparatus, and Program
Hitachi High-tech Corporation
0 cites
US124995322025
Computer and Visual Inspection Method for Identifying Defective Products
Hitachi, Ltd.
0 cites
US123336952025
Sample Observation System and Image Processing Method
HITACHI HIGH-TECH CORPORATION
0 cites
US122605452025
Sample Observation Device and Method
Hitachi High-tech Corporation
0 cites
US121542642024
Defect Inspecting System and Defect Inspecting Method
HITACHI HIGH-TECH CORPORATION
0 cites
US116705282023
Wafer Observation Apparatus and Wafer Observation Method
HITACHI HIGH-TECH CORPORATION
0 cites