8 Patents
- US124742602025Terahertz Signal Measuring Apparatus and Measuring Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- 0 cites
- US121659332024Semiconductor Substrate Processing Apparatus and Semiconductor Substrate Measuring Apparatus Using the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - 0 cites
- US116808982023Hybrid Probe, Physical Property Analysis Apparatus Including the Same, and Method of Measuring Semiconductor Device Using the Apparatus
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US115791672023Probe for Detecting Near Field and Near-field Detection System Including the Same
Samsung Electronics Co., Ltd.
0 cites - US115791682023Probe for Detecting Near Field and Near-field Detecting System Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites