Nam Cheol Jeon

4 Patents

• US126188932026

  Apparatus and Method of Measuring Reliability for Flash Memory Material Through a Current Measurement

  SK Hynic Inc.

  0 cites
• US124759632025

  Method of Measuring Refractive Index of Semiconductor Memory Device and Method of Classifying Product Group Using the Same

  SK Hynix Inc.

  0 cites
• US124695642025

  Memory Device and Operating Method of the Memory Device

  SK Hynix Inc.

  0 cites
• US123275932025

  Memory Device and Operating Method of the Memory Device

  SK Hynix Inc.

  0 cites