Patents/Inventors

Nachiketa Chauhan

TokyoJP1 patent

2 Patents

US124293272025
Method of Producing a Model for Estimating Film Thickness of Workpiece, Method of Estimating Film Thickness of Workpiece Using Such a Model, and Computer Readable Storage Medium Storing Program for Causing Computer to Perform the Methods
EBARA CORPORATION
0 cites
US117599132023
Polishing Method and Polishing Apparatus
EBARA CORPORATION
0 cites