Patents/Inventors

Myoung Chan Na

Yeosu-siKR2 patents

3 Patents

US121814262024
System and Method for Inspecting Defects of Structure by Using X-ray
NEUF Inc.
0 cites
US118218542023
System and Method for Inspecting Defects of Structure by Using X-ray
NEUF Inc.
0 cites
US115857682023
System and Method for Inspecting Defects of Structure by Using X-ray
NEUF Inc.
0 cites