Mykola Kaplenko

3 Patents

• US119011552024

  Method of Aligning a Charged Particle Beam Apparatus

  FEI Company

  0 cites
• US118154792023

  Method of Examining a Sample Using a Charged Particle Beam Apparatus

  FEI Company

  0 cites
• US117034682023

  Method and System for Determining Sample Composition from Spectral Data

  FEI Company

  0 cites