Patents/Inventors

Mohamed Buhary Rinzan

Manlius, NYUS2 patents

3 Patents

US122665522025
System and Method for Monitoring Semiconductor Processes
INFICON, Inc.
0 cites
US122278462025
Monitoring Thin Film Deposition
INFICON, Inc.
0 cites
US119292702024
Unconsumed Precursor Monitoring
0 cites