3 Patents
- US125297252026Systems and Methods for Magnetic Susceptometry of Devices with Magnetometry
NEW YORK UNIVERSITY
0 cites - US123527112025System and Method for Magnetic Resonance Mapping of Physical and Chemical Changes in Conducting Structures
NEW YORK UNIVERSITY
0 cites - US119210672024System and Method for Magnetic Resonance Mapping of Physical and Chemical Changes in Conducting Structures
New York University
0 cites