Patents/Inventors

Mitsunori Numata

YokohamaJP3 patents

4 Patents

US124396072025
Inspection Device
Samsung Electronics Co., Ltd.
0 cites
US122284992025
Pupil Ellipsometry Measurement Apparatus and Method and Method of Fabricating Semiconductor Device Using the Pupil Ellipsometry Measurement Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US117619062023
Optical Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US116041362023
Pupil Ellipsometry Measurement Apparatus and Method and Method of Fabricating Semiconductor Device Using the Pupil Ellipsometry Measurement Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites