3 Patents
- US125043812025Processing Device and Inspection Apparatus for Optical Inspection and Corresponding Methods
LEICA MICROSYSTEMS (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US124516192025Broadband Millimeter Wave Circularly Polarized Antenna Element, Single-mode Array and Dual-mode Array
ANHUI UNIVERSITY
0 cites - US120685422024Bidirectional Circularly Polarized Antenna Element and Bidirectional Circularly Polarized Array Antenna
Anhui University
0 cites