Minh-chau Huynh

2 Patents

• US124074262025

  Probes for Device Testing

  LITEPOINT CORPORATION

  0 cites
• US118355632023

  System and Method for Using Pulsed Radio Frequency (RF) Signals and a Modulated Scattering Probe (MSP) to Enable Measurements of Distance to and Planarity of a Surface of a Device Under Test (DUT)

  LITEPOINT CORPORATION

  0 cites